Title :
Assessment system of emerging technology maturity level based on CMM
Author :
Yan, Lou ; Bo, Shi ; Lucheng, Huang
Author_Institution :
Economic and Management School, Beijing University of Technology, China
Abstract :
Emerging technology maturity level is the basis of emerging technology assessment, with special characteristics. Based on existing assessment on new technology maturity level, assessment system of emerging technology maturity level is builded combined with software capability maturity model (CMM), through Dephi, expert consultation, forums and interviews and other methods, and the reliability of indicators.
Keywords :
Capability maturity model; Coordinate measuring machines; Economics; Educational institutions; Interviews; Presses; Software; CMM; TRL; assessment system; emerging technology maturity level;
Conference_Titel :
Information Science and Engineering (ICISE), 2010 2nd International Conference on
Conference_Location :
Hangzhou, China
Print_ISBN :
978-1-4244-7616-9
DOI :
10.1109/ICISE.2010.5691463
