Title :
Hybrid intelligent fault diagnosis based on adaptive lifting wavelet and multi-class support vector machine
Author :
Shen, Zhong-jie ; Cheng, Xue-feng ; He, Zheng-jia
Author_Institution :
State Key Lab. for Manuf. Syst. Eng., Xi´´an Jiaotong Univ., Xi´´an, China
Abstract :
To diagnose compound faults of rotating machine, this paper presents a novel hybrid intelligent fault diagnosis model based on adaptive lifting wavelet and multi-class support vector machine. First of all, the adaptive lifting wavelet is constructed to mach the signal local characteristics. The original signal is decomposed into approximation signal and detail signal. Secondly, 32 time-domain statistical features are evaluated and some salient features are selected from them by applying the distance evaluation technique. Finally, multi-class support vector machine (SVM) is applied. The testing classification accuracy with salient features of the proposed model reaches to 98.32%, which is 5.32% and 5.04% higher than classification with the salient features of original signal and the salient features of approximation signal and detail signal decomposed by second generation wavelet. It shows that the proposed model can effectively lock signal local characteristics, recognize different fault categories and enhance classification accuracy.
Keywords :
fault diagnosis; machinery; mechanical engineering computing; pattern classification; statistical analysis; support vector machines; time-domain analysis; wavelet transforms; adaptive lifting wavelet; approximation signal; distance evaluation technique; fault category recognition; hybrid intelligent fault diagnosis; multiclass support vector machine; rotating machine; second generation wavelet; signal decomposition; signal local characteristics; testing classification accuracy; time-domain statistical features; Accuracy; Approximation methods; Fault diagnosis; Feature extraction; Support vector machines; Testing; Wavelet transforms; Adaptive lifting wavelet; Hybrid intelligent; Multi-class support vector machine; Salient features;
Conference_Titel :
Wavelet Analysis and Pattern Recognition (ICWAPR), 2010 International Conference on
Conference_Location :
Qingdao
Print_ISBN :
978-1-4244-6530-9
DOI :
10.1109/ICWAPR.2010.5576405