DocumentCode :
2153860
Title :
Clutter statistical analysis for high resolution SAR data
Author :
Fernandez, Pascale Dubois ; Cantalloube, Hubert ; Dupuis, Xavier
Author_Institution :
DEMR, ONERA, France
Volume :
3
fYear :
2004
fDate :
20-24 Sept. 2004
Firstpage :
1781
Abstract :
The ONERA RAMSES system (Radar Aeroporte Multi-spectral d´Etude des Signatures) is a flexible SAR system in constant evolution developed mainly as a test bench for new technologies and to provide specific data for TDRI (Target Detection, Recognition and Identification) algorithm evaluation. It is flown on a Transall C160 platform operated by the CEV (Centre d´Essais en Vol). Recently, the system was upgraded to include a very high resolution mode in X, Ku and Ka bands. The resolution cell is then only a few wavelength wide and the usual hypothesis underlying the speckle phenomena, i.e., a large number of scatterers per resolution cell, is not verified. This work presents the analysis made on the clutter statistical behavior and contrasts the change of behavior observed when shifting from medium resolution to high resolution to very high resolution. It is based on actual radar data acquired with the RAMSES radar system. A new parameter identifying the largest spatial resolution for which the natural surface can no longer be considered homogeneous (in a speckle based criteria) is proposed. This parameter characterizes the scale of the contributing scatterers.
Keywords :
geophysical signal processing; geophysical techniques; radar clutter; radar imaging; radar resolution; radar target recognition; radar tracking; remote sensing by radar; synthetic aperture radar; target tracking; CEV; Centre d´Essais en Vol; Ka band; Ku band; ONERA RAMSES system; RAMSES radar; Radar Aeroporte Multispectral d´Etude des Signatures; TDRI algorithm evaluation; Target Detection-Recognition and Identification algorithm; Transall C160 platform; X band; clutter statistical analysis; flexible SAR system; high resolution SAR data; resolution cell; spatial resolution; speckle phenomena; Clutter; Object detection; Radar scattering; Scattering parameters; Spatial resolution; Speckle; Statistical analysis; Synthetic aperture radar; System testing; Target recognition;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Geoscience and Remote Sensing Symposium, 2004. IGARSS '04. Proceedings. 2004 IEEE International
Print_ISBN :
0-7803-8742-2
Type :
conf
DOI :
10.1109/IGARSS.2004.1370679
Filename :
1370679
Link To Document :
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