Analysis of EMI dependence on signal duty and supplied voltage

Author

Lee, Pilsoo ; Wee, Jae-Kyung ; Lee, Kyoo-Yeong ; Song, Inchae ; Kim, Boo-Gyoun

Author_Institution

Sch. of Electron. Eng., Soongsil Univ., Seoul

fYear

2009

fDate

12-15 May 2009

Firstpage

1

Lastpage

4

Abstract

In this paper, we analyzed EMI dependence on signal duty ratio and power supplied voltage. The EMI levels of the chip-mounted modules were tested and the near-field and far-field emission levels were measured at 800 MHz frequency (the 2^nd harmonic of the clock). The relation between EMI levels and line spectra of signals was analyzed for chip design quality, especially including clock generation circuitry and data paths. In addition, voltage-scaling operation and slew rate control operation which affect radiated emission levels, were tested to investigate the effect of duty ratio and slew asymmetry on EMI generation.

Keywords

electromagnetic interference; integrated circuit testing; chip design quality; chip-mounted modules; clock generation circuitry; data paths; electromagnetic interference; frequency 800 MHz; integrated circuit testing; signal duty ratio; slew rate control; supplied voltage; Chip scale packaging; Circuit testing; Clocks; Electromagnetic interference; Frequency measurement; Power supplies; Semiconductor device measurement; Signal analysis; Signal generators; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Signal Propagation on Interconnects, 2009. SPI '09. IEEE Workshop on

Conference_Location

Strasbourg

Print_ISBN

978-1-4244-4490-8

Electronic_ISBN

978-1-4244-4489-2

Type

conf

DOI

10.1109/SPI.2009.5089869

Filename

5089869