• DocumentCode
    2154372
  • Title

    Density modulated microwave power devices

  • Author

    Vanderplaats, N.R. ; Zaidman, E.G. ; Kodis, M.A.

  • Author_Institution
    US Naval Res. Lab., Washington, DC, USA
  • fYear
    1988
  • fDate
    11-14 Dec. 1988
  • Firstpage
    526
  • Lastpage
    529
  • Abstract
    The authors describe a coupled experimental and simulation approach to understanding the properties and behaviour of an emission-gated electron beam at UHF frequencies. The emission-gated amplifier experiment (EGAE) will provide laboratory measurements of the electron beam at 300 MHz for comparison with a self-consistent, multidimensional PIC (particle-in-cell) simulation. Key research issues include distortion of the premodulated beam by self-field effects in the acceleration region and nonlinear wave-particle interactions in the prebunching and power-extraction regions. The prospects for preconditioning the beam and/or tapering the interaction circuit to improve harmonic suppression and enhanced efficiency are evaluated. The authors present simulation results illustrating the flow of the electron beam in the gun region.<>
  • Keywords
    microwave amplifiers; microwave tubes; 300 MHz; EGAE; UHF frequencies; acceleration region; density modulated microwave power devices; distortion; electron beam flow; emission-gated amplifier experiment; emission-gated electron beam; enhanced efficiency; gun region; harmonic suppression; laboratory measurements; microwave tubes; model; multidimensional particle in cell simulation; nonlinear wave-particle interactions; power-extraction regions; prebunching; preconditioning; premodulated beam; research issues; self-field effects; simulation results; Circuit simulation; Distortion measurement; Electron beams; Frequency; Microwave devices; Multidimensional systems; Optical coupling; Particle beams; Particle measurements; UHF measurements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1988. IEDM '88. Technical Digest., International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0163-1918
  • Type

    conf

  • DOI
    10.1109/IEDM.1988.32870
  • Filename
    32870