Wide temperature operation of a PWM DC-DC convertor

Author

Ray, Biswajit ; Patterson, Richard L.

Author_Institution

Dept. of Electr. & Comput. Eng., Puerto Rico Univ., Mayaguez, Puerto Rico

Volume

2

fYear

1995

fDate

8-12 Oct 1995

Firstpage

971

Abstract

Wide temperature electronics is of great interest for space exploration programs. In this study, the wide temperature (-185°C to 200°C) operation of a 150 W, 50 kHz, 24/48 V pulse-width modulated (PWM) boost DC-DC power converter is reported. The power MOSFET, the power rectifier and the input inductor were placed inside a temperature chamber, whereas the rest of the power and control circuitry as well as all measuring instruments were at room temperature. The power converter efficiency varied between 92.2% and 89.4% in the entire temperature range. The power MOSFET loss decreased with decreasing temperatures. For the diode rectifier, loss increased with decreasing as well as increasing temperatures compared to room temperature operation. The inductor loss also increased due to increasing as well as decreasing temperatures compared to room temperature operation. Overall, the power converter operated successfully in a wide temperature range designed with commercially available components. Wide temperature operation of power capacitors and control circuitry, and the relevant reliability issues for passive and active components are to be addressed for design and operation of wide temperature electronic systems

Keywords

DC-DC power convertors; PWM power convertors; field effect transistor switches; losses; power MOSFET; power capacitors; power field effect transistors; power inductors; power semiconductor diodes; power semiconductor switches; rectifying circuits; space vehicle power plants; switching circuits; -185 to 200 C; 150 W; 24 V; 28 V; 50 kHz; 89.4 to 92.2 percent; PWM boost DC-DC power converter; diode rectifier; input inductor; loss; power MOSFET; power capacitors; power rectifier; reliability; space exploration; wide temperature electronics; Inductors; MOSFET circuits; Power MOSFET; Power system reliability; Pulse width modulation; Pulse width modulation converters; Rectifiers; Space exploration; Temperature control; Temperature distribution;

fLanguage

English

Publisher

ieee

Conference_Titel

Industry Applications Conference, 1995. Thirtieth IAS Annual Meeting, IAS '95., Conference Record of the 1995 IEEE

Conference_Location

Orlando, FL

ISSN

0197-2618

Print_ISBN

0-7803-3008-0

Type

conf

DOI

10.1109/IAS.1995.530406

Filename

530406