DocumentCode :
2154684
Title :
Flip-chip for space applications : Bonding reliability, DC and RF results
Author :
George, Sébastien ; Drevon, Claude ; Cazaux, Jean-Louis
Author_Institution :
ALCATEL SPACE INDUSTRIES - BP1187 - 31037 TOULOUSE Cedexl - France. sebastien.george@space.alcatel.fr
fYear :
2000
fDate :
Oct. 2000
Firstpage :
1
Lastpage :
4
Abstract :
This paper presents a study of flip-chip bonding for space applications. DC and mechanical test vehicles have demonstrated the reliability of the flip-chip gold-gold thermocompression bonding up to 500 thermal cycles. RF test vehicles have proved the compatibility of both coplanar and microstrip on-the-shelves MMICs with the flip-chip bonding up to 35 GHz.
Keywords :
Bonding; Contact resistance; Electrical resistance measurement; Gold; MMICs; Microstrip; Radio frequency; Substrates; Testing; Vehicles;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 2000. 30th European
Conference_Location :
Paris, France
Type :
conf
DOI :
10.1109/EUMA.2000.338745
Filename :
4139758
Link To Document :
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