• DocumentCode
    2154925
  • Title

    Fast physical optics calculation for SAR imaging of complex scatterers

  • Author

    Stephanson, Matthew B. ; Lee, Jin-Fa

  • Author_Institution
    ElectroScience Labratory, Ohio State Univ., Columbus, OH, USA
  • fYear
    2012
  • fDate
    8-14 July 2012
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    The physical optics (PO) approximation is often used to the approximate the scattering from electrically large, perfectly conducting (PEC) objects. To quickly generate radar cross section data of a large range of aspect angles and frequencies, several methods are used to accelerate the PO calculation. There are: (1) multi-level Z-buffering for self-shadowing calculations, (2) Gordon´s method for integration, (3) accelerated frequency sampling, and (4) Fourier interpolation of the RCS. The results show the utility of combining these methods, which typically have been applied individually. The physical optics (PO) approximation is widely used to the approximate the scattering from electrically large, perfectly conducting (PEC) objects. Such applications including generating synthetic aperture radar (SAR) test data, which requires the scattering problem to be solved for many incident plane wave directions and frequencies. This paper is concerned with quickly and accurately evaluating this data.
  • Keywords
    Fourier analysis; electromagnetic wave scattering; interpolation; radar cross-sections; synthetic aperture radar; Fourier interpolation; Gordon´s method; PO calculation; RCS; SAR imaging; accelerated frequency sampling; complex scatterers; fast physical optics calculation; incident plane wave directions; multilevel Z-buffering; perfectly conducting objects; physical optics approximation; scattering problem; self-shadowing calculations; synthetic aperture radar; Acceleration; Complexity theory; Interpolation; Physical optics; Radar cross section; Scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium (APSURSI), 2012 IEEE
  • Conference_Location
    Chicago, IL
  • ISSN
    1522-3965
  • Print_ISBN
    978-1-4673-0461-0
  • Type

    conf

  • DOI
    10.1109/APS.2012.6349077
  • Filename
    6349077