DocumentCode
2155052
Title
A 3.3fJ/conversion-step 250kS/s 10b SAR ADC using optimized vote allocation
Author
Ahmadi, Mahdi ; Won Namgoong
Author_Institution
Dept. of Electr. Eng., Univ. of Texas at Dallas, Dallas, TX, USA
fYear
2013
fDate
22-25 Sept. 2013
Firstpage
1
Lastpage
4
Abstract
This paper presents a 10b successive approximation register (SAR) analog-to-digital converter (ADC) that operates at 0.5V supply voltage and supports a flexible differential input dynamic range from 0.4V to 1V. The proposed ADC employs a majority vote comparison along with a non-binary architecture to alleviate the effect of comparator noise in scaled input voltage swings. To maximize performance subject to comparator power level constraints, the allocation of votes is optimized for each bit cycle. The prototype, fabricated in 65nm CMOS process, achieves ENOB ranging from 7.1b to 9.1b and FOM from 3.3 to 6.8fJ/conversion step while operating at 250kS/s.
Keywords
CMOS integrated circuits; analogue-digital conversion; comparators (circuits); integrated circuit noise; ADC; CMOS process; SAR; analog-to-digital converter; comparator noise; nonbinary architecture; optimized vote allocation; power level constraints; size 65 nm; successive approximation register; voltage 0.4 V to 1.4 V; word length 10 bit; Capacitors; Dynamic range; Nickel; Noise; Power demand; Solid state circuits; Voltage measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Custom Integrated Circuits Conference (CICC), 2013 IEEE
Conference_Location
San Jose, CA
Type
conf
DOI
10.1109/CICC.2013.6658425
Filename
6658425
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