• DocumentCode
    2155052
  • Title

    A 3.3fJ/conversion-step 250kS/s 10b SAR ADC using optimized vote allocation

  • Author

    Ahmadi, Mahdi ; Won Namgoong

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Texas at Dallas, Dallas, TX, USA
  • fYear
    2013
  • fDate
    22-25 Sept. 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper presents a 10b successive approximation register (SAR) analog-to-digital converter (ADC) that operates at 0.5V supply voltage and supports a flexible differential input dynamic range from 0.4V to 1V. The proposed ADC employs a majority vote comparison along with a non-binary architecture to alleviate the effect of comparator noise in scaled input voltage swings. To maximize performance subject to comparator power level constraints, the allocation of votes is optimized for each bit cycle. The prototype, fabricated in 65nm CMOS process, achieves ENOB ranging from 7.1b to 9.1b and FOM from 3.3 to 6.8fJ/conversion step while operating at 250kS/s.
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; comparators (circuits); integrated circuit noise; ADC; CMOS process; SAR; analog-to-digital converter; comparator noise; nonbinary architecture; optimized vote allocation; power level constraints; size 65 nm; successive approximation register; voltage 0.4 V to 1.4 V; word length 10 bit; Capacitors; Dynamic range; Nickel; Noise; Power demand; Solid state circuits; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference (CICC), 2013 IEEE
  • Conference_Location
    San Jose, CA
  • Type

    conf

  • DOI
    10.1109/CICC.2013.6658425
  • Filename
    6658425