Title :
Reflection Photoelastic Tomography for the Detection of Axial Stress Distribution in Planar Optical Waveguides
Author :
Ferrario, Maddalena ; Licciardello, Alberto ; Pietralunga, Silvia M. ; Martinelli, Mario
Author_Institution :
CoreCom, Milan
Abstract :
In this paper a novel scheme of photoelastic tomography is described, to be applied to planar waveguides. It exploits the reflection of the laser probe beam at the waveguide-substrate interface to reconstruct stress distributions in waveguide cross sections. By this technique, spurious or induced local stress variations in integrated optics components can also be brought into evidence.
Keywords :
optical planar waveguides; optical testing; optical tomography; photoelasticity; stress measurement; axial stress distribution; laser probe beam; planar optical waveguides; reflection photoelastic tomography; waveguide substrate interface; Laser beams; Optical planar waveguides; Optical reflection; Optical waveguides; Photoelasticity; Planar waveguides; Probes; Stress; Tomography; Waveguide lasers;
Conference_Titel :
Lasers and Electro-Optics, 2007 and the International Quantum Electronics Conference. CLEOE-IQEC 2007. European Conference on
Conference_Location :
Munich
Print_ISBN :
978-1-4244-0931-0
Electronic_ISBN :
978-1-4244-0931-0
DOI :
10.1109/CLEOE-IQEC.2007.4386164
