• DocumentCode
    2155367
  • Title

    HEMT VLSI technology using nonalloyed ohmic contacts

  • Author

    Kuroda, S. ; Harada, N. ; Katakami, T. ; Mimura, T. ; Abe, M.

  • Author_Institution
    Fujitsu Lab. Ltd., Atsugi, Japan
  • fYear
    1988
  • fDate
    11-14 Dec. 1988
  • Firstpage
    680
  • Lastpage
    683
  • Abstract
    The authors propose HEMT (high electron mobility transistor) VLSI technology using nonalloyed ohmic contacts. For large integration levels, nonalloyed ohmic contacts have two advantages. One is their extremely short ohmic length, and the other is that direct connection between source/drain and gate can be made with the same metal. The propagation delay time of a ring oscillator with one-metal simultaneous formation of the source/drain and gate was 37 ps/gate (L/sub g/=0.9 mu m), comparable to that of conventional HEMT ring oscillators. The number of contact holes in a six-transistor basic memory cell was eight using a conventional technique and was reduced to three using the new technique. The memory cell size was reduced to 21.5*21.5 mu m/sup 2/, which may be the smallest area ever reported for a GaAs SRAM (static random access memory).<>
  • Keywords
    III-V semiconductors; VLSI; field effect integrated circuits; gallium arsenide; high electron mobility transistors; integrated circuit technology; integrated memory circuits; metallisation; ohmic contacts; oscillators; random-access storage; 0.9 micron; 21.5 micron; 37 ps; GaAs; HEMT VLSI technology; SRAM; high electron mobility transistor; large integration levels; memory cell size; nonalloyed ohmic contacts; number of contact holes; one-metal simultaneous formation; propagation delay time; ring oscillator; semiconductors; short ohmic length; six-transistor basic memory cell; static random access memory; Contact resistance; Doping; Fabrication; Gallium arsenide; HEMTs; Indium gallium arsenide; Laboratories; Ohmic contacts; Tunneling; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1988. IEDM '88. Technical Digest., International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0163-1918
  • Type

    conf

  • DOI
    10.1109/IEDM.1988.32904
  • Filename
    32904