DocumentCode
2155367
Title
HEMT VLSI technology using nonalloyed ohmic contacts
Author
Kuroda, S. ; Harada, N. ; Katakami, T. ; Mimura, T. ; Abe, M.
Author_Institution
Fujitsu Lab. Ltd., Atsugi, Japan
fYear
1988
fDate
11-14 Dec. 1988
Firstpage
680
Lastpage
683
Abstract
The authors propose HEMT (high electron mobility transistor) VLSI technology using nonalloyed ohmic contacts. For large integration levels, nonalloyed ohmic contacts have two advantages. One is their extremely short ohmic length, and the other is that direct connection between source/drain and gate can be made with the same metal. The propagation delay time of a ring oscillator with one-metal simultaneous formation of the source/drain and gate was 37 ps/gate (L/sub g/=0.9 mu m), comparable to that of conventional HEMT ring oscillators. The number of contact holes in a six-transistor basic memory cell was eight using a conventional technique and was reduced to three using the new technique. The memory cell size was reduced to 21.5*21.5 mu m/sup 2/, which may be the smallest area ever reported for a GaAs SRAM (static random access memory).<>
Keywords
III-V semiconductors; VLSI; field effect integrated circuits; gallium arsenide; high electron mobility transistors; integrated circuit technology; integrated memory circuits; metallisation; ohmic contacts; oscillators; random-access storage; 0.9 micron; 21.5 micron; 37 ps; GaAs; HEMT VLSI technology; SRAM; high electron mobility transistor; large integration levels; memory cell size; nonalloyed ohmic contacts; number of contact holes; one-metal simultaneous formation; propagation delay time; ring oscillator; semiconductors; short ohmic length; six-transistor basic memory cell; static random access memory; Contact resistance; Doping; Fabrication; Gallium arsenide; HEMTs; Indium gallium arsenide; Laboratories; Ohmic contacts; Tunneling; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1988. IEDM '88. Technical Digest., International
Conference_Location
San Francisco, CA, USA
ISSN
0163-1918
Type
conf
DOI
10.1109/IEDM.1988.32904
Filename
32904
Link To Document