Title :
Optimality analysis for power/ground grid automatic generation in early design stage
Author :
Cai, Yici ; Shi, Jin ; Hong, Xianlong
Author_Institution :
Dept. of Comput. Sci. & Tech, Tsinghua Univ., Beijing, China
Abstract :
As the number of on die transistors continues to increase, whether it is possible to generate a near optimum P/G grid automatically in early design stage will significantly affects design closure. In this paper, optimal conditions for P/G grid automatic generation are discussed. We prove that for regular grid, there does not exist a global optimal point at which both metal usage and maximal voltage drop can be minimized. Also, an efficient algorithm is proposed to generate Pareto optimal P/G grid. Experimental results show that the proposed algorithm is more efficient than the classical wire sizing strategy.
Keywords :
Pareto analysis; VLSI; integrated circuit design; integrated circuit reliability; transistors; Pareto optimal P/G grid; VLSI; die transistors; maximal voltage drop; optimality analysis; power-ground grid automatic generation; wire sizing strategy; Geometry; Manufacturing; Mesh generation; Packaging; Pareto analysis; Power generation; Rails; Transistors; Voltage; Wire;
Conference_Titel :
Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-2185-5
Electronic_ISBN :
978-1-4244-2186-2
DOI :
10.1109/ICSICT.2008.4735036