Single-node SOR method for statistical 3D thermal analysis

Author

Luo, Zu-ying ; Zhu, Tong ; Li, Qiao ; Yu, Xian-Chuan

Author_Institution

Dept. of Electron., Beijing Normal Univ., Beijing, China

fYear

2008

fDate

20-23 Oct. 2008

Firstpage

2341

Lastpage

2344

Abstract

As the first study on statistical 3D thermal analysis, we propose an efficient method for fewer over-hot spots. The new method, called SN-SOR (single-node SOR), is based on a novel localized relaxed iterative approach and it can perform statistical analysis on one over-hot spot at a time. Experiments show that SN-SOR is 590X faster than Monte-Carlo method with small errors and is 29X faster than general global SOR(successive over relaxation) method in statistical analysis of 450 over-hot spots. As a result, SN-SOR only take average 0.1481 second to statistically analyze one over-hot spot for a large test case of 1.3 M nodes under spatially correlated energy and thermal conductance disturbances.

Keywords

Monte Carlo methods; VLSI; integrated circuit design; iterative methods; statistical analysis; thermal analysis; Monte-Carlo method; VLSI technologies design; iterative approach; single-node SOR method; statistical 3D thermal analysis; successive over relaxation method; thermal conductance disturbances; Analysis of variance; Fluctuations; Iterative methods; Statistical analysis; Steady-state; Temperature distribution; Temperature sensors; Testing; Thermal conductivity; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on

Conference_Location

Beijing

Print_ISBN

978-1-4244-2185-5

Electronic_ISBN

978-1-4244-2186-2

Type

conf

DOI

10.1109/ICSICT.2008.4735049

Filename

4735049