DocumentCode :
2155822
Title :
Determination of band off-sets in MBE grown GaAlAs/GaAs/GaAlAs quantum well heterostructures: application of DLTS and photoluminescence under hydrostatic pressure
Author :
Saxena, Ashok K.
Author_Institution :
Dept. of Electron. & Comput. Eng., IIT, Roorkee, India
fYear :
2002
fDate :
11-13 Dec. 2002
Firstpage :
507
Lastpage :
510
Abstract :
It is shown that capacitance spectroscopy on quantum well heterostructures using Schottky barrier diodes, combined with photoluminescence (PL) measurements provides a powerful tool in determining conduction and valence band discontinuities, which are determined to be 72% and 28% of the band gap difference. The electron capture is indicative of a Coulomb´s repulsive field. The C-V measurements have also been interpreted to physically locate the position of the well under the surface and the result agrees closely with the value of electrochemical profiling. Further, capacitance spectroscopy under hydrostatic pressure has been used to identify the quantum well and bulk trap emissions. Two electron bulk traps at 0.84 eV and 0.73 eV in the top GaAlAs layer were also detected and the 0.84 eV level is possibly a complex of gallium vacancy and arsenic-gallium antisite defect.
Keywords :
III-V semiconductors; Schottky barriers; Schottky diodes; aluminium compounds; capacitance; conduction bands; deep level transient spectroscopy; defect states; electron traps; gallium arsenide; molecular beam epitaxial growth; photoluminescence; semiconductor growth; semiconductor heterojunctions; semiconductor quantum wells; vacancies (crystal); valence bands; 0.73 eV; 0.84 eV; C-V measurements; Coulomb repulsive field; DLTS; GaAlAs-GaAs-GaAlAs; GaAlAs/GaAs/GaAlAs quantum well heterostructures; MBE; Schottky barrier diodes; arsenic-gallium antisite defect; band off-sets; bulk trap emissions; capacitance spectroscopy; conduction band discontinuity; electrochemical profiling; electron capture; gallium vacancy; hydrostatic pressure; photoluminescence; valence band discontinuity; Capacitance measurement; Electron traps; Gallium arsenide; Photoluminescence; Photonic band gap; Quantum capacitance; Radioactive decay; Schottky barriers; Schottky diodes; Spectroscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optoelectronic and Microelectronic Materials and Devices, 2002 Conference on
ISSN :
1097-2137
Print_ISBN :
0-7803-7571-8
Type :
conf
DOI :
10.1109/COMMAD.2002.1237301
Filename :
1237301
Link To Document :
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