DocumentCode :
2155863
Title :
Interdiffusion in InGaAs quantum dots by ion implantation
Author :
Lever, P. ; Tan, H.H. ; Reece, P. ; Gal, M. ; Jagadish, C.
Author_Institution :
Dept. of Electron. Mater. Eng., Australian Nat. Univ., Canberra, ACT, Australia
fYear :
2002
fDate :
11-13 Dec. 2002
Firstpage :
515
Lastpage :
518
Abstract :
Implantation induced interdiffusion of InGaAs quantum dots has been carried out using hydrogen and arsenic ions. Large energy shifts and significant narrowing was seen in the photoluminescence spectra of the implanted and annealed samples. Lower implantation doses were required to create similar energy shifts in quantum dot samples than reported in the quantum well case. The energy shifts and photoluminescence intensities were found to depend on the ions used, as well as the amount of damage created in the samples. Temperature dependent implantations were found to follow the trends reported for quantum wells.
Keywords :
III-V semiconductors; arsenic; chemical interdiffusion; gallium arsenide; hydrogen; indium compounds; ion implantation; photoluminescence; rapid thermal annealing; semiconductor quantum dots; InGaAs quantum dots; InGaAs:H,I; annealing; arsenic ions; energy shifts; hydrogen ions; interdiffusion; ion implantation; photoluminescence spectra; Annealing; Gallium arsenide; Hydrogen; Indium gallium arsenide; Ion implantation; Photoluminescence; Quantum dot lasers; Quantum dots; Temperature; US Department of Transportation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optoelectronic and Microelectronic Materials and Devices, 2002 Conference on
ISSN :
1097-2137
Print_ISBN :
0-7803-7571-8
Type :
conf
DOI :
10.1109/COMMAD.2002.1237303
Filename :
1237303
Link To Document :
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