Title :
Growth and spectroscopy of II-VI CdSe quantum dots
Author :
Cavenett, B.C. ; Tang, X. ; Bradford, C. ; Urbaszek, B. ; Graham, T.C.M. ; Warburton, R.J. ; Funato, M. ; Prior, K.A.
Author_Institution :
Dept. of Phys., Heriot-Watt Univ., Edinburgh, UK
Abstract :
In this paper we review the recent progress in the growth and spectroscopy of CdSe quantum dots. In particular, atomic layer epitaxy (ALE) has been used to grow ZnSe/CdSe and ZnSe/CdSe:Mn magnetic quantum dots. For samples grown without a ZnSe capping layer, dot densities of the order of 109 cm-2 were measured by atomic force microscopy (AFM). In the capped samples, the ensemble dot photoluminescence (PL) was observed over a range of energies between 2.1 and 2.5 eV and in the high Mn concentration samples a spectrally broad emission at 2.15 eV from the internal Mn2+ transition. Single dot spectroscopy was carried out by confocal microscopy and the PL linewidth was measured as a function of Mn concentration. Also, CdSe/MgS quantum dots have been grown successfully by molecular beam epitaxy using a thermally activated reorganization process that occurs during growth interruption. Unlike the ZnSe/CdSe dots the PL measurements show emission from both QDs and the wetting layer, with emission energies ranging between (2.3 and 3.8 eV). AFM topography and μm-PL measurements also show evidence of quantum dot structures and power dependent PL measurements carried out on the dots give a value of 30 meV for the bi-exciton binding energy at 77 K.
Keywords :
II-VI semiconductors; atomic force microscopy; atomic layer epitaxial growth; biexcitons; binding energy; cadmium compounds; magnesium compounds; magnetic semiconductors; manganese; molecular beam epitaxial growth; photoluminescence; semiconductor doping; semiconductor growth; semiconductor quantum dots; zinc compounds; 2.1 to 3.8 eV; 30 meV; 77 K; ALE; CdSe quantum dots; CdSe/MgS quantum dots; Mn concentration; ZnSe-CdSe; ZnSe-CdSe:Mn; atomic force microscopy; atomic layer epitaxy; bi-exciton binding energy; confocal microscopy; magnetic quantum dots; molecular beam epitaxy; photoluminescence; single dot spectroscopy; Atomic force microscopy; Atomic layer deposition; Atomic measurements; Energy measurement; Epitaxial growth; Force measurement; Power measurement; Quantum dots; Spectroscopy; Zinc compounds;
Conference_Titel :
Optoelectronic and Microelectronic Materials and Devices, 2002 Conference on
Print_ISBN :
0-7803-7571-8
DOI :
10.1109/COMMAD.2002.1237310