DocumentCode
2156053
Title
Growth and spectroscopy of II-VI CdSe quantum dots
Author
Cavenett, B.C. ; Tang, X. ; Bradford, C. ; Urbaszek, B. ; Graham, T.C.M. ; Warburton, R.J. ; Funato, M. ; Prior, K.A.
Author_Institution
Dept. of Phys., Heriot-Watt Univ., Edinburgh, UK
fYear
2002
fDate
11-13 Dec. 2002
Firstpage
545
Lastpage
550
Abstract
In this paper we review the recent progress in the growth and spectroscopy of CdSe quantum dots. In particular, atomic layer epitaxy (ALE) has been used to grow ZnSe/CdSe and ZnSe/CdSe:Mn magnetic quantum dots. For samples grown without a ZnSe capping layer, dot densities of the order of 109 cm-2 were measured by atomic force microscopy (AFM). In the capped samples, the ensemble dot photoluminescence (PL) was observed over a range of energies between 2.1 and 2.5 eV and in the high Mn concentration samples a spectrally broad emission at 2.15 eV from the internal Mn2+ transition. Single dot spectroscopy was carried out by confocal microscopy and the PL linewidth was measured as a function of Mn concentration. Also, CdSe/MgS quantum dots have been grown successfully by molecular beam epitaxy using a thermally activated reorganization process that occurs during growth interruption. Unlike the ZnSe/CdSe dots the PL measurements show emission from both QDs and the wetting layer, with emission energies ranging between (2.3 and 3.8 eV). AFM topography and μm-PL measurements also show evidence of quantum dot structures and power dependent PL measurements carried out on the dots give a value of 30 meV for the bi-exciton binding energy at 77 K.
Keywords
II-VI semiconductors; atomic force microscopy; atomic layer epitaxial growth; biexcitons; binding energy; cadmium compounds; magnesium compounds; magnetic semiconductors; manganese; molecular beam epitaxial growth; photoluminescence; semiconductor doping; semiconductor growth; semiconductor quantum dots; zinc compounds; 2.1 to 3.8 eV; 30 meV; 77 K; ALE; CdSe quantum dots; CdSe/MgS quantum dots; Mn concentration; ZnSe-CdSe; ZnSe-CdSe:Mn; atomic force microscopy; atomic layer epitaxy; bi-exciton binding energy; confocal microscopy; magnetic quantum dots; molecular beam epitaxy; photoluminescence; single dot spectroscopy; Atomic force microscopy; Atomic layer deposition; Atomic measurements; Energy measurement; Epitaxial growth; Force measurement; Power measurement; Quantum dots; Spectroscopy; Zinc compounds;
fLanguage
English
Publisher
ieee
Conference_Titel
Optoelectronic and Microelectronic Materials and Devices, 2002 Conference on
ISSN
1097-2137
Print_ISBN
0-7803-7571-8
Type
conf
DOI
10.1109/COMMAD.2002.1237310
Filename
1237310
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