Title :
Polycide/metal capacitors for high precision A/D converters
Author :
Kaya, C. ; Tigelaar, H. ; Paterson, J. ; de Wit, M. ; Fattaruso, J. ; Hester, D. ; Kiriakai, S. ; Tan, K.-S. ; Tsay, F.
Author_Institution :
Texas Instrum., Dallas, TX, USA
Abstract :
The authors present a novel metal-to-silicide-polysilicon capacitor and compare it with metal-to-polysilicon capacitors and conventional polysilicon-to-polysilicon capacitors. Voltage coefficient data for these capacitor structures with oxide, oxide/nitride, oxide/nitride/oxide, and nitride dielectrics are also discussed. It is shown that when metal-to-silicided polysilicon capacitors are used, voltage coefficients of less than 4 p.p.m./V can be attained, which is considerably less than that obtained when metal-to-poly or conventional poly-to-poly capacitors are used. For high-precision A/D converters, this value will make possible accuracies of up to 18 bits through self-calibration.<>
Keywords :
analogue-digital conversion; capacitors; integrated circuit technology; A/D converters; high precision ADC; metal/silicide/poly-Si capacitor; nitride dielectrics; oxide dielectric; oxide/nitride dielectric; oxide/nitride/oxide dielectric; polycide/metal capacitors; polycrystalline Si; self-calibration; voltage coefficients; Annealing; Capacitance; Capacitors; Costs; Dielectric materials; Fabrication; Instruments; Low voltage; Process design; Temperature;
Conference_Titel :
Electron Devices Meeting, 1988. IEDM '88. Technical Digest., International
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/IEDM.1988.32928