Title :
A double-sampling cross noise-coupled Sigma Delta modulator with a reduced amount of opamps
Author :
De Bock, M. ; Rombouts, P.
Author_Institution :
Dept. ELIS, Ghent Univ. (UGent), Ghent, Belgium
Abstract :
This paper presents the design of a second order double-sampling split path Sigma Delta modulator with cross noise-coupling. The power budget for the double-sampling is reduced by using bilinear integrators, while cross noise-coupling between the two modulator loops increases the noise shaping to third order. The implementation of the noise-coupling is incorporated into the second integrator using a novel delaying feed-forward circuit. The complete modulator is integrated in a 130nm CMOS technology and operates at a 120 MHz clock frequency. It achieves 77.8dB dynamic range and 71.4dB SNDR over a 5MHz bandwidth.
Keywords :
CMOS integrated circuits; operational amplifiers; sigma-delta modulation; CMOS technology; SNDR; bandwidth 5 MHz; bilinear integrator; cross noise-coupling; double-sampling split path sigma delta modulator; feed-forward circuit; frequency 120 MHz; noise shaping; opamps; second order sigma delta modulator; size 130 nm; Bandwidth; Calibration; Clocks; Modulation; Noise; Noise shaping; Quantization (signal);
Conference_Titel :
Custom Integrated Circuits Conference (CICC), 2013 IEEE
Conference_Location :
San Jose, CA
DOI :
10.1109/CICC.2013.6658466