Title :
Broadband Birefringence of GaP Nanowires
Author :
Diedenhofen, Silke L. ; Muskens, Otto L. ; Borgström, Magnus T. ; Bakkers, E.P.A. ; Rivas, J.G.
Author_Institution :
FOM Inst. for Atomic & Molecular Phys. AMOLF, Eindhoven
Abstract :
Here, we present the first broadband birefringence measurements on samples of GaP nanowires. The samples are grown vertically in the metal-organic vapor phase epitaxy (MOVPE) using the vapor-liquid-solid (VLS) growth mode.
Keywords :
III-V semiconductors; MOCVD; birefringence; gallium compounds; nanowires; vapour phase epitaxial growth; GaP; MOVPE; broadband birefringence measurements; metal-organic vapor phase epitaxy; nanowires; vapor-liquid-solid growth mode; Birefringence; Laboratories; Metamaterials; Nanowires; Optical interferometry; Optical materials; Optical polarization; Optical sensors; Refractive index; Wavelength measurement;
Conference_Titel :
Lasers and Electro-Optics, 2007 and the International Quantum Electronics Conference. CLEOE-IQEC 2007. European Conference on
Conference_Location :
Munich
Print_ISBN :
978-1-4244-0931-0
Electronic_ISBN :
978-1-4244-0931-0
DOI :
10.1109/CLEOE-IQEC.2007.4386230
