• DocumentCode
    2156982
  • Title

    Effects of MMIC-Design and GaAs Technology on mm-Wave Module Production Yield

  • Author

    Adelseck, Bemd ; Schroth, Joerg ; Meiners, Ulf ; Quentin, Pierre

  • Author_Institution
    EADS Deutschland GmbH
  • fYear
    2000
  • fDate
    Oct. 2000
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    mm-Wave Telecommunication and Radar modules for civil applications on the basis of GaAs-MMICs are now going into mass production with several thousand devices per year. As price for these modules is a very important factor for success and GaAs-MMICs are one of the cost driving factors an overall high production yield has to be achieved. Different measures are taken into account at EADS together with UMS and are described in this paper
  • Keywords
    Costs; Current measurement; Frequency measurement; Gallium arsenide; Intrusion detection; MMICs; Mass production; Robustness; Semiconductor device measurement; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 2000. 30th European
  • Conference_Location
    Paris, France
  • Type

    conf

  • DOI
    10.1109/EUMA.2000.338831
  • Filename
    4139844
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2156982