Title :
Effects of MMIC-Design and GaAs Technology on mm-Wave Module Production Yield
Author :
Adelseck, Bemd ; Schroth, Joerg ; Meiners, Ulf ; Quentin, Pierre
Author_Institution :
EADS Deutschland GmbH
Abstract :
mm-Wave Telecommunication and Radar modules for civil applications on the basis of GaAs-MMICs are now going into mass production with several thousand devices per year. As price for these modules is a very important factor for success and GaAs-MMICs are one of the cost driving factors an overall high production yield has to be achieved. Different measures are taken into account at EADS together with UMS and are described in this paper
Keywords :
Costs; Current measurement; Frequency measurement; Gallium arsenide; Intrusion detection; MMICs; Mass production; Robustness; Semiconductor device measurement; Voltage;
Conference_Titel :
Microwave Conference, 2000. 30th European
Conference_Location :
Paris, France
DOI :
10.1109/EUMA.2000.338831
