• DocumentCode
    2157645
  • Title

    The effects of annealing on the behavior of field emission source

  • Author

    Takahashi, E. ; Takasaki, I. ; Mitsui, H. ; Sone, M.

  • Author_Institution
    Musashi Inst. of Technol., Tokyo, Japan
  • Volume
    1
  • fYear
    1994
  • fDate
    3-8 Jul 1994
  • Firstpage
    254
  • Abstract
    Characteristic of prebreakdown emission current has been studied. It is known that the electrons are emitted from minute projections on the cathode surface where the field strength is more than 10 [V/cm]. We observed the location of emission sites by using a micro-channel-plate with a luminescent screen, and discussed the effects of the heat treatment on the behavior of emission sites. As a result, the heat treatment decreases not only the number of emission sites but also the number of electrons emitted from one projection. And the annealing effect becomes conspicuously with increasing the temperature of annealing
  • Keywords
    Annealing; Cathodes; Current measurement; Electron emission; Heat pumps; Heat treatment; Insulation; Surface treatment; Temperature; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials, 1994., Proceedings of the 4th International Conference on
  • Conference_Location
    Brisbane, Qld.
  • Print_ISBN
    0-7803-1307-0
  • Type

    conf

  • DOI
    10.1109/ICPADM.1994.413987
  • Filename
    413987