• DocumentCode
    2157795
  • Title

    A 60GHz, linear, direct down-conversion mixer with mm-Wave tunability in 32nm CMOS SOI

  • Author

    Sanduleanu, Mihai A. T. ; Valdes-Garcia, A. ; Liu, Yanbing ; Parker, Brendon ; Shlafman, Shlomo ; Sheinman, B. ; Elad, Danny ; Reynolds, S. ; Friedman, Daniel

  • Author_Institution
    IBM T. J. Watson Res. Center, Yorktown Heights, NY, USA
  • fYear
    2013
  • fDate
    22-25 Sept. 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The gain/linearity trade-off is exploited to achieve the best linearity performance of a mm-Wave down-conversion system. The achieved linearity (IIP3) for the whole down-conversion chain is better than 11.06dBm for 5.8dB gain at 60GHz. Gain can be adjusted from -15dB to 11dB in 1dB steps depending on the signal level. By adjusting phase matching at RF input and the common-mode impedance of the mixer with a variable transmission line, the input phase imbalance can be corrected and the second-order distortion (HD2) can be reduced. The LO/RF isolation is 43dB and the LO/IF isolation is better than 82dB. The down-converter occupies 1.38mm2 in 32nm CMOS SOI and consumes 19.2mW from 1V supply. The power consumption of the mixer itself is 4mW @ 1V supply.
  • Keywords
    CMOS integrated circuits; mixers (circuits); silicon-on-insulator; CMOS SOI; LO/IF isolation; LO/RF isolation; RF input; best linearity performance; common mode impedance; direct down conversion mixer; down conversion chain; down converter; frequency 60 GHz; gain -15 dB; gain 11 dB; gain 5.8 dB; input phase imbalance; mm-wave down conversion system; mm-wave tunability; phase matching; power 19.2 mW; power 4 mW; power consumption; second order distortion; signal level; size 32 nm; variable transmission line; voltage 1 V; CMOS integrated circuits; Impedance; Linearity; Mixers; Power transmission lines; Radio frequency; Transmission line measurements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference (CICC), 2013 IEEE
  • Conference_Location
    San Jose, CA
  • Type

    conf

  • DOI
    10.1109/CICC.2013.6658525
  • Filename
    6658525