• DocumentCode
    2157819
  • Title

    A fully integrated highly linear receiver with automatic IP2 calibration schemes for multi-standard applications

  • Author

    Borna, Amir ; Yanjie Wang ; Hull, Christopher ; Hua Wang ; Niknejad, A.

  • Author_Institution
    Berkeley Wireless Res. Center, UC Berkeley, Berkeley, CA, USA
  • fYear
    2013
  • fDate
    22-25 Sept. 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper presents an entire receiver chain from RF to baseband with fully integrated self-calibration circuitries for suppressing the 2nd-order intermodulation (IM2) distortions in Homodyne receivers for multi-standard applications. All the potential sources for IM2 generation are identified and tackled independently in the proposed receiver by architectural and calibration techniques, which results in a very robust IP2 enhancement with independency of the amplitude and the frequency of the blockers. The prototype receiver implemented in a 90 nm CMOS process achieves at least 10 dB improvement on the receiver IP2 performance at high-power blockers and less than 100 μs calibration cycle for whole receiver chain. It potentially provides truly SAW-Less, fully integrated, and frequency-agile receivers.
  • Keywords
    CMOS integrated circuits; calibration; intermodulation distortion; radio receivers; 2nd-order intermodulation distortion suppression; CMOS process; IM2 distortions; SAW-less receivers; amplitude independency; automatic IP2 calibration schemes; frequency-agile receivers; fully integrated highly linear receiver; fully integrated self-calibration circuitry; high-power blockers; homodyne receivers; multistandard applications; receiver chain; robust IP2 enhancement; size 90 nm; Baseband; CMOS integrated circuits; Calibration; Mixers; Radio frequency; Receivers; Transistors; Direct down-conversion receiver; IP2 enhancement; automatic calibration; multi-standard radio;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference (CICC), 2013 IEEE
  • Conference_Location
    San Jose, CA
  • Type

    conf

  • DOI
    10.1109/CICC.2013.6658526
  • Filename
    6658526