DocumentCode :
2157835
Title :
Test circuits for verification of power device models
Author :
Pendharkar, S. ; Winterhalter, C. ; Trivedi, M. ; Li, H. ; Kurnia, A. ; Divan, D. ; Shenai, K.
Author_Institution :
Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
Volume :
2
fYear :
1995
fDate :
8-12 Oct 1995
Firstpage :
1055
Abstract :
One of the most important components of any modern power converter topology is the power semiconductor device. To predict the behavior of high-power devices in complex circuits it is necessary to accurately characterize them. Because of the cost involved in building complex circuits, it is often necessary to carry out extensive simulations to understand the device behavior under various operating conditions imposed by the particular circuit topology. For accurate simulations, it is necessary to develop good and accurate device models using advanced device simulation tools. The device models are generally developed using static and some switching measurement data. To verify the accuracy of these models, the simulation data must be compared with the measured data under different operating conditions. Test circuits used to carry out such simulations and measurements must satisfy a number of criteria such as robustness, accuracy, cost efficiency and repeatability. In addition, they should be easy to simulate accurately. This paper presents some simple and accurate test circuits used for the verification of various power device models
Keywords :
circuit testing; field effect transistor switches; power MOSFET; power convertors; power field effect transistors; power semiconductor switches; semiconductor device models; semiconductor device testing; MOSFET switches; accuracy; cost efficiency; measurements; power converter topology; power device models verification; power semiconductor; repeatability; robustness; simulations; test circuits; Circuit simulation; Circuit testing; Circuit topology; Computational modeling; Costs; Drives; Power semiconductor devices; Predictive models; Semiconductor device testing; Semiconductor diodes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Conference, 1995. Thirtieth IAS Annual Meeting, IAS '95., Conference Record of the 1995 IEEE
Conference_Location :
Orlando, FL
ISSN :
0197-2618
Print_ISBN :
0-7803-3008-0
Type :
conf
DOI :
10.1109/IAS.1995.530419
Filename :
530419
Link To Document :
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