Title :
Diagnosing resistive bridges using adaptive techniques
Author :
Ghosh-Dastidar, Jayabrata ; Touba, Nur A.
Author_Institution :
Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA
Abstract :
A systematic procedure for locating resistive bridges is presented. Critical path tracing is used to identify a set of “suspect” bridges whose presence could explain all of the observed faulty behavior of the circuit for the original test set. The set of suspects is then reduced by adaptively applying additional tests derived from the failing vector pairs in the original test set. Unlike other approaches, the approach presented here is not based on any bridge fault modeling and does not require any fault simulation
Keywords :
automatic testing; fault diagnosis; integrated circuit testing; logic testing; adaptive techniques; critical path tracing; failing vector pairs; resistive bridges; systematic procedure; test set; Bridge circuits; Circuit faults; Circuit simulation; Circuit testing; Delay; Dictionaries; Fault diagnosis; Logic devices; Logic gates; Threshold voltage;
Conference_Titel :
Custom Integrated Circuits Conference, 2000. CICC. Proceedings of the IEEE 2000
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-5809-0
DOI :
10.1109/CICC.2000.852622
