A stand-alone integrated excitation/extraction system for analog BIST applications

Author

Hafed, Mohamed M. ; Roberts, Gordon W.

Author_Institution

Microelectron. & Comput. Syst. Lab., McGill Univ., Montreal, Que., Canada

fYear

2000

fDate

2000

Firstpage

83

Lastpage

86

Abstract

An integrated test core for mixed-signal circuits is described. The core consists of a completely digital implementation, except for a simple reconstruction filter and a comparator. It is capable of both generating arbitrary band-limited waveforms (for excitation purposes) and coherently digitizing arbitrary periodic analog waveforms (for DSP-based test and measurement). A prototype IC was fabricated in a 0.35 μm CMOS process and was demonstrated to perform various curve tracing, oscilloscope, and spectrum analysis tasks

Keywords

CMOS integrated circuits; built-in self test; integrated circuit testing; mixed analogue-digital integrated circuits; waveform generators; 0.35 micron; ASIC; CMOS process; DSP-based measurement; DSP-based test; analog BIST applications; band-limited waveform generation; comparator; curve tracing tasks; integrated excitation/extraction system; integrated test core; mixed-signal circuits; oscilloscope tasks; periodic analog waveforms; reconstruction filter; spectrum analysis tasks; stand-alone system; Application software; Band pass filters; Built-in self-test; Circuit testing; Digital filters; Hardware; Laboratories; Microelectronics; Signal generators; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Custom Integrated Circuits Conference, 2000. CICC. Proceedings of the IEEE 2000

Conference_Location

Orlando, FL

Print_ISBN

0-7803-5809-0

Type

conf

DOI

10.1109/CICC.2000.852623

Filename

852623