• DocumentCode
    2157935
  • Title

    A stochastic sampling time-to-digital converter with tunable 180–770fs resolution, INL less than 0.6LSB, and selectable dynamic range offset

  • Author

    Tandon, James S. ; Yamaguchi, Takahiro J. ; Komatsu, Satoshi ; Asada, Kunihiro

  • Author_Institution
    VDEC-D2T, Univ. of Tokyo, Tokyo, Japan
  • fYear
    2013
  • fDate
    22-25 Sept. 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    We introduce a stochastic time-to-digital converter (TDC) that has 180-770fs tunable resolution, less than 0.6LSB INL, and selectable dynamic range offset. Previous arbiter-based TDCs have fine resolution but small dynamic range which is difficult to calibrate. Our approach uses comparators as decision elements to precisely control dynamic range offset.
  • Keywords
    comparators (circuits); stochastic processes; time-digital conversion; TDC; comparators; dynamic range offset control; selectable dynamic range offset; stochastic sampling time-to-digital converter; Clocks; Dynamic range; Oscilloscopes; Semiconductor device measurement; Timing; Transfer functions; Voltage measurement; TDC; comparator; comparator group; offset voltage; stochastic; time-to-digital converter; variation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference (CICC), 2013 IEEE
  • Conference_Location
    San Jose, CA
  • Type

    conf

  • DOI
    10.1109/CICC.2013.6658531
  • Filename
    6658531
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2157935