Wire pair negative-index material at terahertz frequencies

This paper presents simulation and experimental results of a metallic wire-pair structure (H-pair) negative-index materials (NIM) and examine the dielectric characteristics of this structure in the THz frequency range using THz time-domain spectroscopy (TDS). This structure possesses negative index features at normal incidence. This makes measurements, that are otherwise difficult to carry out, possible. Similar structures have previously been demonstrated to exhibit a negative index of refraction at around 15.8 GHz. The composite structure is fabricated on top of a silicon wafer, as a dielectric/metal multilayer system containing the H-pair wire structures with benzocyclobutene (BCB) polymer as dielectric material.