Title :
A systematic approach to power diode characterization and model validation
Author :
Duliere, Jeffrey L. ; Mantooth, H. Alan ; Ferry, R.G.
Author_Institution :
Analogy Inc., Beaverton, OR, USA
Abstract :
A process for validating power diode models and characterizing devices to these models is described. This approach has been successfully applied to a number of diode models and a wide variety of diode technologies. This paper concentrates on gathering the necessary data to accurately characterize devices and validate model performance
Keywords :
power semiconductor diodes; semiconductor device models; semiconductor device testing; data gathering; diode technologies; model performance; model validation; power diode characterization; Data mining; Design engineering; Electronic components; Light emitting diodes; Physics; Power engineering and energy; Power system modeling; Schottky diodes; Trademarks; Virtual manufacturing;
Conference_Titel :
Industry Applications Conference, 1995. Thirtieth IAS Annual Meeting, IAS '95., Conference Record of the 1995 IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-3008-0
DOI :
10.1109/IAS.1995.530421
