DocumentCode :
2158668
Title :
Defect-tolerant implementation of a systolic array for two-dimensional convolution
Author :
Rönner, Karsten ; Hecht, Volker ; Pirsch, Peter
Author_Institution :
Lab. fuer Informationstechnol., Hannover Univ., Germany
fYear :
1991
fDate :
29-31 Jan 1991
Firstpage :
19
Lastpage :
25
Abstract :
A defect-tolerant, advanced VLSI-implementation of the two-dimensional convolution algorithm for real-time processing is presented. The chip contrasts with previously published convolution chips by its maximum mask size of 256 tabs (dividable into up to four independent masks which were applied to the same video-signal) support of adaptive filtering, on-chip delay-lines, and implemented special processing of frame-borders. Yield-enhancement techniques and architectural concepts for the design of large-area chips have been investigated and applied to the chip-design. Yield calculations show that, by the combination of new architectural concepts, effective hierarchical reconfiguration schemes, layout redundancies, and design of global parts using conservative design-rules, a high yield increase (67%) with low area overhead (6%) has been achieved
Keywords :
VLSI; digital signal processing chips; systolic arrays; video signals; adaptive filtering; advanced VLSI-implementation; area overhead; conservative design-rules; defect-tolerant; frame-borders; hierarchical reconfiguration schemes; large-area chips; layout redundancies; mask size; on-chip delay-lines; real-time processing; systolic array; two-dimensional convolution; video-signal; yield; Adaptive filters; Circuits; Convolution; Delay; Image processing; Laboratories; Parallel processing; Power generation economics; Redundancy; Systolic arrays;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Wafer Scale Integration, 1991. Proceedings., [3rd] International Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
0-8186-9126-3
Type :
conf
DOI :
10.1109/ICWSI.1991.151691
Filename :
151691
Link To Document :
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