• DocumentCode
    2158802
  • Title

    Variation and analog modeling

  • Author

    McConaghy, Trent ; Chen, Brian

  • fYear
    2013
  • fDate
    22-25 Sept. 2013
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    AMS, RF, and memory circuits can be highly susceptible to performance degradation caused by process variation, thermal noise, and other non-idealities. This session presents recent advances in modeling these effects, gaining insight into their operation, and techniques to mitigate them.
  • Keywords
    CMOS integrated circuits; Integrated circuit modeling; MOSFET; Noise; Radio frequency; Semiconductor device modeling; Thermal noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference (CICC), 2013 IEEE
  • Conference_Location
    San Jose, CA, USA
  • Type

    conf

  • DOI
    10.1109/CICC.2013.6658560
  • Filename
    6658560
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2158802