DocumentCode :
2158973
Title :
Advanced memory topics
Author :
Niii, Koji ; Kirihata, Toshiaki
fYear :
2013
fDate :
22-25 Sept. 2013
Firstpage :
1
Lastpage :
1
Abstract :
This session covers scaling challenges, latest advances, and future trends on spin-torque MRAM, NAND, and logic-compatible flash, TCAM, and 6T/8T SRAM in advanced technology nodes.
Keywords :
Arrays; Error correction codes; Flash memories; Parity check codes; Random access memory; Three-dimensional displays; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Custom Integrated Circuits Conference (CICC), 2013 IEEE
Conference_Location :
San Jose, CA, USA
Type :
conf
DOI :
10.1109/CICC.2013.6658564
Filename :
6658564
Link To Document :
بازگشت