DocumentCode
2158973
Title
Advanced memory topics
Author
Niii, Koji ; Kirihata, Toshiaki
fYear
2013
fDate
22-25 Sept. 2013
Firstpage
1
Lastpage
1
Abstract
This session covers scaling challenges, latest advances, and future trends on spin-torque MRAM, NAND, and logic-compatible flash, TCAM, and 6T/8T SRAM in advanced technology nodes.
Keywords
Arrays; Error correction codes; Flash memories; Parity check codes; Random access memory; Three-dimensional displays; Voltage measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Custom Integrated Circuits Conference (CICC), 2013 IEEE
Conference_Location
San Jose, CA, USA
Type
conf
DOI
10.1109/CICC.2013.6658564
Filename
6658564
Link To Document