Title :
Advanced memory topics
Author :
Niii, Koji ; Kirihata, Toshiaki
Abstract :
This session covers scaling challenges, latest advances, and future trends on spin-torque MRAM, NAND, and logic-compatible flash, TCAM, and 6T/8T SRAM in advanced technology nodes.
Keywords :
Arrays; Error correction codes; Flash memories; Parity check codes; Random access memory; Three-dimensional displays; Voltage measurement;
Conference_Titel :
Custom Integrated Circuits Conference (CICC), 2013 IEEE
Conference_Location :
San Jose, CA, USA
DOI :
10.1109/CICC.2013.6658564
