DocumentCode :
2159016
Title :
The role of spacer surface conditions in the scatter of charge accumulations in SF6
Author :
Jing, T. ; Morshuis, P.H.F. ; Kreuger, F.H.
Author_Institution :
Inst. of Stand. & Ind. Res., Singapore
Volume :
1
fYear :
1994
fDate :
3-8 Jul 1994
Firstpage :
274
Abstract :
A cylindrical epoxy spacer with different surface roughnesses was stressed under +150 kV in SF6. It is found that artificial roughness has no significant influence on the charge accumulation. Influences come from the variation in the surface conditions of the spacer by roughening it artificially. An additional test also shows that the micro structure at the spacer surface is more responsible for the large scatter of charge accumulation than that at the electrodes
Keywords :
Charge measurement; Dielectrics; Electrodes; Flashover; Permittivity; Rough surfaces; Scattering; Surface roughness; Surface treatment; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Properties and Applications of Dielectric Materials, 1994., Proceedings of the 4th International Conference on
Conference_Location :
Brisbane, Qld.
Print_ISBN :
0-7803-1307-0
Type :
conf
DOI :
10.1109/ICPADM.1994.413992
Filename :
413992
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2159016
بازگشت