Title :
AMS verification in advanced technologies
Author :
Onodera, Hidetoshi ; Cao, Yu Kevin
Author_Institution :
Kyoto University
Abstract :
Verification of Analog and Mixed-Signal(AMS) circuits and systems is increasingly challenging. This session explores novel AMS simulation and emulation techniques, and advanced reliability and performance issues with technology scaling.
Keywords :
Adaptation models; Electrostatic discharges; Emulation; Integrated circuit modeling; Logic gates; Resistance; Solid modeling;
Conference_Titel :
Custom Integrated Circuits Conference (CICC), 2013 IEEE
Conference_Location :
San Jose, CA, USA
DOI :
10.1109/CICC.2013.6658571
