• DocumentCode
    2159162
  • Title

    AMS verification in advanced technologies

  • Author

    Onodera, Hidetoshi ; Cao, Yu Kevin

  • Author_Institution
    Kyoto University
  • fYear
    2013
  • fDate
    22-25 Sept. 2013
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Verification of Analog and Mixed-Signal(AMS) circuits and systems is increasingly challenging. This session explores novel AMS simulation and emulation techniques, and advanced reliability and performance issues with technology scaling.
  • Keywords
    Adaptation models; Electrostatic discharges; Emulation; Integrated circuit modeling; Logic gates; Resistance; Solid modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference (CICC), 2013 IEEE
  • Conference_Location
    San Jose, CA, USA
  • Type

    conf

  • DOI
    10.1109/CICC.2013.6658571
  • Filename
    6658571
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2159162