• DocumentCode
    2159230
  • Title

    Synchronous rectifier as a test circuit for high-frequency power MOSFET model verification

  • Author

    Fischer, K. ; Shenai, K.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
  • Volume
    2
  • fYear
    1995
  • fDate
    8-12 Oct 1995
  • Firstpage
    1091
  • Abstract
    The power vertical double diffused MOSFET (DMOSFET) structure incorporates many parasitic structures which are difficult to model in physically based circuit simulators. Low voltage ultralow on-resistance vertical power DMOSFETs were used as synchronous rectifiers in a high-density microelectronics power supply. The circuit was first simulated using an advanced mixed device and circuit simulator in which the power DMOSFETs were represented as two-dimensional (2-D) finite element grid structures and semiconductor transport and charge balance equations were solved subject to terminal boundary conditions imposed by the circuit operation. Mixed simulation results are compared with pure circuit simulation results using an advanced behavioral circuit simulator in which a high-frequency lumped equivalent circuit model is used to represent the DMOSFETs. The proposed approach is a powerful tool to validate circuit simulation models of complex power devices
  • Keywords
    circuit analysis computing; digital simulation; equivalent circuits; finite element analysis; power MOSFET; power supplies to apparatus; rectifying circuits; semiconductor device models; 2-D finite element grid structures; DMOSFET; charge balance equations; circuit simulation; circuit simulators; high-density microelectronics power supply; high-frequency lumped equivalent circuit model; high-frequency power MOSFET model; low voltage; mixed device and circuit simulator; parasitic structures; power vertical double diffused MOSFET; pure circuit simulation; semiconductor transport equations; synchronous rectifier; terminal boundary conditions; test circuit; ultralow on-resistance vertical power DMOSFET; Circuit simulation; Circuit testing; Finite element methods; Low voltage; MOSFET circuits; Microelectronics; Power MOSFET; Power supplies; Rectifiers; Two dimensional displays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Conference, 1995. Thirtieth IAS Annual Meeting, IAS '95., Conference Record of the 1995 IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    0197-2618
  • Print_ISBN
    0-7803-3008-0
  • Type

    conf

  • DOI
    10.1109/IAS.1995.530424
  • Filename
    530424