Title :
Charge Transport in Magnetic Semiconductor p-n Heterojunctions
Author :
Jindong Liu ; Peters, John A. ; Rangaraju, Nikhil ; Wessels, Bruce W.
Author_Institution :
Dept. of Mater. Sci. & Eng., Northwestern Univ., Evanston, IL, USA
Abstract :
Previously, the p-n-p bipolar magnetic junction transistor was demonstrated using a magnetic semiconductor InMnAs as the collector. A current gain βdc as high as 20 of the transistor is observed at 300 K. A negative magnetoamplification of -150% is obtained when the applied magnetic field is 8 T. In order to assess the gain mechanism for such transistors, we measured the minority carrier lifetime in a p-n InMnAs/InAs heterojunction diode. A minority carrier lifetime of 320 ns was obtained at room temperature. For the p-n-p MJT, a decrease in the emitter injection efficiency with the magnetic field is observed for the various base currents, which is attributed to the positive magnetoresistance of the p-type InMnAs. The emitter injection efficiency decreases with the magnetic field leading to the observed negative magnetic amplification.
Keywords :
III-V semiconductors; carrier lifetime; indium compounds; magnetic fields; magnetoelectronics; magnetoresistance; manganese compounds; semiconductor heterojunctions; InMnAs-InAs; applied magnetic field; base currents; charge transport; current gain; emitter injection efficiency; gain mechanism; magnetic flux density 8 T; magnetic semiconductor p-n heterojunctions; minority carrier lifetime; negative magnetic amplification; negative magnetoamplification; p-n heterojunction diode; p-n-p bipolar magnetic junction transistor; positive magnetoresistance; temperature 300 K; time 320 ns; Charge carrier lifetime; Heterojunctions; Magnetic semiconductors; Magnetic tunneling; Semiconductor device measurement; Semiconductor diodes; Transistors; Bipolar magnetic junction transistors (MJTs); charge transport; lifetime; magnetic semiconductors; p-n heterojunctions; spintronics;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2015.2446956