• DocumentCode
    2159661
  • Title

    A noise-tolerant dynamic circuit design technique

  • Author

    Balamurugan, Ganesh ; Shanbhag, Naresh R.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    425
  • Lastpage
    428
  • Abstract
    A new circuit technique, referred to as the twin-transistor technique, for increasing the noise immunity of dynamic logic circuits is presented. This technique makes dynamic logic gates more tolerant to noise appearing at the gate inputs. A multiply-accumulate circuit has been designed and fabricated using a 0.35 μm process to verify this technique. Experimental results indicate that the twin-transistor technique provides a significant improvement in the noise immunity of dynamic circuits (>2.4 X) with only a modest increase in power dissipation (15%) and no loss in throughput
  • Keywords
    CMOS logic circuits; integrated circuit design; integrated circuit noise; logic design; logic gates; 0.35 micron; dynamic circuit design technique; dynamic logic circuits; dynamic logic gates; multiply-accumulate circuit; noise-tolerant circuit design; twin-transistor technique; Circuit noise; Circuit synthesis; Circuit testing; Crosstalk; Delay; Integrated circuit noise; Logic circuits; Noise level; Power dissipation; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 2000. CICC. Proceedings of the IEEE 2000
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    0-7803-5809-0
  • Type

    conf

  • DOI
    10.1109/CICC.2000.852700
  • Filename
    852700