• DocumentCode
    2159732
  • Title

    Analysis of jitter due to power-supply noise in phase-locked loops

  • Author

    Heydari, Payam ; Pedram, Massoud

  • Author_Institution
    Dept. of Electr. Eng. Syst., Univ. of Southern California, Los Angeles, CA, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    443
  • Lastpage
    446
  • Abstract
    Phase-locked loops (PLL) in RF and mixed signal VLSI circuits experience supply noise which translates to a timing jitter. In this paper an analysis of the timing jitter due to the noise on the power supply rails is presented. Stochastic models of the power supply noise in VLSI circuits for different values of on-chip decoupling capacitances are presented first. This is followed by calculation of the phase noise of the voltage-controlled oscillator (VCO) in terms of the statistical properties of supply noise. Finally the timing jitter of the PLL is predicted in response to the VCO phase noise. A PLL circuit has been designed in 0.35 μm CMOS process, and our mathematical model was applied to determine the timing jitter. Experimental results prove the accuracy of the predicted model
  • Keywords
    CMOS integrated circuits; UHF integrated circuits; VLSI; capacitance; integrated circuit noise; mixed analogue-digital integrated circuits; network analysis; phase locked loops; phase noise; stochastic processes; timing jitter; voltage-controlled oscillators; 0.35 micron; CMOS PLL circuit; RF circuits; VCO phase noise; jitter analysis; mathematical model; mixed signal VLSI circuits; onchip decoupling capacitances; phase-locked loops; power supply noise; power supply rails; statistical properties; stochastic models; timing jitter; voltage-controlled oscillator; Circuit noise; Phase locked loops; Phase noise; Power supplies; RF signals; Radio frequency; Rails; Timing jitter; Very large scale integration; Voltage-controlled oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 2000. CICC. Proceedings of the IEEE 2000
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    0-7803-5809-0
  • Type

    conf

  • DOI
    10.1109/CICC.2000.852704
  • Filename
    852704