Title : 
Fast linear Hough transform
         
        
            Author : 
Vuillemin, Jean E.
         
        
            Author_Institution : 
Res. Lab., Digital Equipment Corp., Paris, France
         
        
        
        
        
        
            Abstract : 
The Hough transform is the choice technique for identifying straight lines through digital images, with applications to high energy physics and computer vision. Classical methods for implementing the Hough transform of a N×N binary image require to compute N3  additions over n=log2(N) bits integers, hence nN3  bit operations per transform. We introduce a new algorithm for computing the fast Hough transform FHT which only requires log2 (N)×N2 additions, for a total of n2N 2 bit operations per transform. The method is based on a recursive algorithm for raster-scan line drawing, which is different from Bresenham´s iterative one The FHT has a divide and conquer recursive structure similar to that of the classical fast Fourier transform FFT algorithm, with simpler atomic operations-additions over n bits numbers-and a more complex interconnect. The FHT algorithm can readily be implemented in software. It maps into hardware as well, and we detail the structure of a bit-serial circuit for computing the FHT
         
        
            Keywords : 
Hough transforms; computer vision; physics; physics computing; atomic operations; binary image; bit-serial circuit; classical fast Fourier transform FFT algorithm; complex interconnect; computer vision; digital images; divide and conquer recursive structure; fast Hough transform FHT; fast linear Hough transform; high energy physics; raster-scan line drawing; recursive algorithm; straight lines; Discrete transforms; Equations; Pixel; Wires;
         
        
        
        
            Conference_Titel : 
Application Specific Array Processors, 1994. Proceedings. International Conference on
         
        
            Conference_Location : 
San Francisco, CA
         
        
        
            Print_ISBN : 
0-8186-6517-3
         
        
        
            DOI : 
10.1109/ASAP.1994.331821