Title :
Proceedings 1994 IEEE International Conference on Computer Design: VLSI in Computers and Processors
Abstract :
The following topics were dealt with: memory architecture; parallel processing and fault tolerance; synthesis for testability; formal representation; concurrent error detection; instruction scheduling; timing analysis; field programmable systems; microprocessor architectures; asynchronous circuit design; state based formal verification; sequential logic synthesis; computer-aided embedded system design; BIST/testability analysis; superscalar processor performance; test generation; asynchronous circuit synthesis; applications of formal methods; software testing; production logic synthesis; special purpose VLSI; interconnect analysis; MCM applications; and CMOS circuit techniques
Keywords :
VLSI; circuit CAD; logic CAD; logic design; logic testing; BIST; CMOS; MCM applications; asynchronous circuit design; asynchronous circuit synthesis; concurrent error detection; embedded system design; fault tolerance; field programmable systems; formal methods; formal representation; formal verification; instruction scheduling; interconnect analysis; memory architecture; microprocessor architectures; parallel processing; production logic synthesis; sequential logic; software testing; special purpose VLSI; superscalar processor performance; test generation; testability; timing analysis;
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 1994. ICCD '94. Proceedings., IEEE International Conference on
Conference_Location :
Cambridge, MA, USA
Print_ISBN :
0-8186-6565-3
DOI :
10.1109/ICCD.1994.331835
