• DocumentCode
    2159904
  • Title

    A linear time implicit congruence sparsification technique for BEM capacitance extraction

  • Author

    Jiang, Rong ; Chen, Charlie Chung-Ping

  • Author_Institution
    Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
  • fYear
    2005
  • fDate
    12-17 June 2005
  • Abstract
    This paper presents an efficient methodology for generating sparsified potential coefficient matrices for three-dimensional capacitance extraction. Previous capacitance extraction algorithms based on boundary element method (BEM) formulate the potential coefficient matrix in terms of surface potentials and charges on those most delicate panels (leaf panels). By introducing the concept of basis charges, we discover that leaf panel charges compose the worst basis which leads to the densest linear system. Therefore, we propose a linear time basis panel selection algorithm to choose a new basis. It is provable that the n × n potential coefficient matrix constructed in terms of the new basis contains O(n) non-zero entries and hence the sparse system can be solved much more efficiently by preconditioned Krylov subspace iterative methods. Experimental results demonstrate the superior runtime and memory consumption over previous approaches while achieving similar accuracy.
  • Keywords
    boundary-elements methods; capacitance measurement; circuit complexity; iterative methods; sparse matrices; surface potential; boundary element method; capacitance extraction; leaf panel charges; linear time basis panel selection algorithm; linear time implicit congruence sparsification; preconditioned Krylov subspace iterative methods; sparsified potential coefficient matrix; surface charges; surface potentials; Boundary element methods; Capacitance; Conductors; Educational institutions; Iterative algorithms; Iterative methods; Linear systems; Sparse matrices; Tree data structures; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2005 IEEE MTT-S International
  • ISSN
    01490-645X
  • Print_ISBN
    0-7803-8845-3
  • Type

    conf

  • DOI
    10.1109/MWSYM.2005.1516958
  • Filename
    1516958