Title :
Estimation of maximum power and instantaneous current using a genetic algorithm
Author :
Jiang, Yi-Min ; Cheng, Kwang-Ting ; Kristic, Ante
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
Abstract :
We present a genetic-algorithm-based approach for estimating the maximum power dissipation and instantaneous current through supply lines for CMOS circuits. Our approach can handle large combinational and sequential circuits with arbitrary but known delays. To obtain accurate results we extract the timing and current information from transistor-level and general-delay gate-level simulation. Our experimental results show that the patterns generated by our approach produce on the average a lower bound on the maximum power which is 41% tighter than the one obtained by weighted random patterns for estimating the maximum power. Also, our lower bound for the maximum instantaneous current is 21% tighter as compared to the weighted random patterns
Keywords :
CMOS logic circuits; VLSI; circuit analysis computing; combinational circuits; delays; genetic algorithms; sequential circuits; timing; CMOS circuits; current information extraction; general-delay gate-level simulation; genetic algorithm; instantaneous current estimation; large combinational circuits; large sequential circuits; maximum power dissipation; maximum power estimation; supply lines; timing information extraction; transistor-level gate-level simulation; Automatic test pattern generation; Circuit simulation; Delay; Genetic algorithms; Power dissipation; Power generation; Runtime; Sequential circuits; Timing; Voltage;
Conference_Titel :
Custom Integrated Circuits Conference, 1997., Proceedings of the IEEE 1997
Conference_Location :
Santa Clara, CA
Print_ISBN :
0-7803-3669-0
DOI :
10.1109/CICC.1997.606601