Title :
Limitations to the size of single-chip electronic neural networks
Author :
Feltham, Derek B I ; Maly, Wojciech
Author_Institution :
Carnegie Mellon Univ., Pittsburgh, PA, USA
Abstract :
The authors analyze and quantify the design tradeoffs which will limit the size of single-chip analog neural networks implemented using standard CMOS technology. Issues investigated include the limits imposed by the neural network architectures themselves, and the related effects of processing variations and defects on the ultimate size of manufacturable neural systems. It is shown that neural networks, even if potentially fault-tolerant, will not automatically provide the capability to make limitless large single-chip integrated circuits
Keywords :
CMOS integrated circuits; neural nets; analog neural networks; design tradeoffs; fault-tolerant; neural network architectures; processing variations; single-chip electronic neural networks; size; standard CMOS technology; CMOS technology; Circuits; Fabrication; Fault tolerance; Feedforward neural networks; Mathematical model; Neural networks; Neurons; Pulp manufacturing; Very large scale integration;
Conference_Titel :
Wafer Scale Integration, 1991. Proceedings., [3rd] International Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
0-8186-9126-3
DOI :
10.1109/ICWSI.1991.151697