Title :
Delay-verifiability of combinational circuits based on primitive faults
Author :
Ke, Wuudiann ; Menon, P.R.
Author_Institution :
Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA
Abstract :
It is shown that verifying the timing of a circuit by testing may require tests which can detect the simultaneous presence of more than one path delay fault. We introduce a special class of path delay faults, called primitive faults, whose detection is shown to be necessary and sufficient to ensure the temporal correctness of a circuit. Using this result, we develop a synthesis procedure for combinational circuits that can be tested for correctness of timing. Experimental data show that such implementations usually require less area than completely delay testable implementations
Keywords :
combinatorial circuits; failure analysis; formal verification; network synthesis; combinational circuits; delay testable implementations; delay-verifiability; path delay fault; primitive faults; synthesis procedure; temporal correctness; Circuit faults; Circuit synthesis; Circuit testing; Combinational circuits; Delay; Electrical fault detection; Fault detection; Logic testing; Robustness; Timing;
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 1994. ICCD '94. Proceedings., IEEE International Conference on
Conference_Location :
Cambridge, MA
Print_ISBN :
0-8186-6565-3
DOI :
10.1109/ICCD.1994.331861