DocumentCode :
2160377
Title :
Conduction property of surface of mica treated with fast atom bombardment
Author :
Sakakibara, T. ; Muramatsu, M. ; Endo, M. ; Hashimoto, Y.
Author_Institution :
Dept. of Electr. & Electron. Eng., Chuo Univ., Tokyo, Japan
Volume :
1
fYear :
1994
fDate :
3-8 Jul 1994
Firstpage :
298
Abstract :
Variations in the surface conduction of cleaved mica due to surface treatment by Ar fast atom bombardment (FAB) were observed. Treatment of the mica surface was carried out, varying the duration of FAB. While a surface current of the order of 10-13 A was measured at a voltage of 117 V for a mica specimen in the virgin state, it was increased by FAB and saturated at the order of 10-8 A with treatment for 20 minutes. Moreover, for a sufficiently treated surface, no change in the current due to relative humidity was observed. As the result of an examination by electron spectroscopy for chemical analysis, it has been found that the peaks for potassium and sodium almost completely disappeared after the FAB treatment. The variation of the geometrical micro structure of the specimen surface was also observed with an atomic force microscope. The conduction property of the modified surface of mica has been discussed, in accordance with the results of the examination of the angle of contact of moisture, and taking into account the variation in the quantity of soluble ions in the mica surface
Keywords :
Argon; Atomic force microscopy; Atomic measurements; Chemical analysis; Current measurement; Electrons; Humidity; Spectroscopy; Surface treatment; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Properties and Applications of Dielectric Materials, 1994., Proceedings of the 4th International Conference on
Conference_Location :
Brisbane, Qld.
Print_ISBN :
0-7803-1307-0
Type :
conf
DOI :
10.1109/ICPADM.1994.413998
Filename :
413998
Link To Document :
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