DocumentCode :
2160453
Title :
Concurrent error detection in high speed carry-free division using alternative input data
Author :
Wey, Chin-Long
Author_Institution :
Dept. of Electr. Eng., Michigan State Univ., East Lansing, MI, USA
fYear :
1994
fDate :
10-12 Oct 1994
Firstpage :
124
Lastpage :
127
Abstract :
Rapid advancements in technology demand innovative computation algorithms and hardware structures to achieve high performance. High speed dividers are commonly designed using SRT division methods. Recently, a high speed carry-free divider design using redundant binary representation has been presented. Based on the carry-free division algorithm and a more general cell fault mode instead of stuck-at fault model, this paper presents a concurrent error detection scheme using alternating input data. The key to the detection of faults is determining that at least one input combination exists for which the error does not result in alternating outputs. Results show that, with a low hardware overhead, the divider circuit is capable of detecting single/multiple transient faults in one cell during the real-time operation and enhancing its reliability significantly
Keywords :
digital arithmetic; dividing circuits; error detection; carry-free divider; carry-free division; cell fault mode; concurrent error detection; concurrent error detection scheme; real-time operation; redundant binary representation; reliability; transient faults; Circuit faults; Circuit testing; Combinational circuits; Electrical fault detection; Equations; Fault detection; Fault diagnosis; Hardware; High performance computing; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 1994. ICCD '94. Proceedings., IEEE International Conference on
Conference_Location :
Cambridge, MA
Print_ISBN :
0-8186-6565-3
Type :
conf
DOI :
10.1109/ICCD.1994.331870
Filename :
331870
Link To Document :
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