Title :
A rapid prototype wafer scale system design for signal and data processing
Author :
Landis, D. ; Brown, H. ; Sanders, T. ; Shahsavari, M. ; Hadjilogiou, J. ; Shankar, R.
Author_Institution :
Univ. of South Florida, Tampa, FL, USA
Abstract :
The authors describe a WSI (wafer scale integration) rapid prototype system design project. Applications which can be implemented as WSI systems are being developed at three universities (alpha sites). A single WSI design is being developed which can be rapidly restructured to meet the system requirements of each university. A system design verification approach that involves a common CAD (computer-aided design) tool base for high-level modeling has been defined by the multiuniversity team. Each alpha site is developing high-level models for their architecture using VHDL (VHSIC hardware description language), and the physical wafer structure will be automatically mapped to the wafer from the VHDL model
Keywords :
VLSI; circuit CAD; microprocessor chips; specification languages; CAD; VHDL; WSI; data processing; high-level models; physical wafer structure; rapid prototype wafer scale system design; signal processing; system design verification approach; Algorithm design and analysis; Data processing; Design automation; Hardware design languages; Logic arrays; Microelectronics; Prototypes; Semiconductor device modeling; Signal processing; Very high speed integrated circuits;
Conference_Titel :
Wafer Scale Integration, 1991. Proceedings., [3rd] International Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
0-8186-9126-3
DOI :
10.1109/ICWSI.1991.151698