DocumentCode :
2160505
Title :
Production test method for evaluating the effect of narrow-band interference on data errors in ultra-wide band (UWB) receivers
Author :
Bhattacharya, Soumendu ; Senguttuvan, Rajarajan ; Chatterjee, Abhijit
Author_Institution :
Sch. of ECE, Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
2005
fDate :
12-17 June 2005
Abstract :
The recent demand in wireless standards capable of providing short-range, high-speed data transfer has accelerated the growth of the ultra-wide band (UWB). In this paper, we develop a low cost production test methodology that quantifies the effects of "in-band" interference from WLAN (802.11a) on the ability of UWB receivers to correctly decode received UWB signals. The analysis presented shows the effect of "in-band" interference on the probability of error for a received \´0\´ bit and a received \´1\´ bit. Using a RF signal generator in pulsed mode as the transmitter, we show that very low values of probability of error (at low interference levels) can be estimated with fewer number of bits transmitted compared to standard production test methods.
Keywords :
IEEE standards; interference (signal); probability; production testing; radio receivers; wireless LAN; RF signal generator; UWB signals; data errors; error probability; in-band interference; narrow-band interference; production test method; ultra-wide band receivers; wireless local area network; wireless standards; Acceleration; Costs; Decoding; Interference; Narrowband; Production; Pulse generation; Signal generators; Testing; Wireless LAN;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2005 IEEE MTT-S International
ISSN :
01490-645X
Print_ISBN :
0-7803-8845-3
Type :
conf
DOI :
10.1109/MWSYM.2005.1516981
Filename :
1516981
Link To Document :
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