• DocumentCode
    2160819
  • Title

    On the design of perfect metamaterial absorbers

  • Author

    Costa, Filippo ; Genovesi, Simone ; Monorchio, Agostino ; Manara, Giuliano

  • Author_Institution
    Dipt. di Ing. dell´´Inf., Univ. di Pisa, Pisa, Italy
  • fYear
    2012
  • fDate
    8-14 July 2012
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Perfect absorbing metamaterials comprising a metallic frequency selective surface printed on a thin low loss grounded substrate are analyzed. An efficient transmission line approach is employed to derive simple formulas which describe in detail the absorption mechanism of the subwavelength structure. In particular, the real part of the input impedance as a function of the imaginary part of the substrate dielectric permittivity is analytically derived in order to show why the presence of moderate losses in the substrate is sufficient to achieve matching with free space, that is, perfect absorption. The shape of the unit cell allows tailoring the absorption bandwidth in correspondence of the chosen resonant frequency. Once fixed the substrate thickness, the choice of low capacitive elements allows obtaining perfect absorption in a small frequency region with very low substrate losses while the choice of highly coupled elements allows obtaining the largest possible bandwidth with higher substrate losses.
  • Keywords
    electromagnetic wave absorption; frequency selective surfaces; metamaterials; permittivity; absorption bandwidth; capacitive elements; metallic frequency selective surface; metamaterial absorber design; perfect absorbing metamaterials; resonant frequency; substrate dielectric permittivity; substrate loss; substrate thickness; subwavelength structure absorption mechanism; thin-low-loss grounded substrate; transmission line approach; Absorption; Dielectrics; Frequency selective surfaces; Impedance; Metamaterials; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium (APSURSI), 2012 IEEE
  • Conference_Location
    Chicago, IL
  • ISSN
    1522-3965
  • Print_ISBN
    978-1-4673-0461-0
  • Type

    conf

  • DOI
    10.1109/APS.2012.6349298
  • Filename
    6349298