DocumentCode :
2160978
Title :
Rotary spare replacement redundancy for tree architecture WSIs
Author :
Tsuda, Nobuo
Author_Institution :
NTT Commun. & Inf. Process. Lab., Tokyo, Japan
fYear :
1991
fDate :
29-31 Jan 1991
Firstpage :
83
Lastpage :
89
Abstract :
The author proposes rotary spare replacement redundancy (RSRR) for defect tolerance in tree architecture WSIs. The main feature of the RSRR is that it can be applied in element groups of a subroot element and its leaf elements on every neighboring two stages, using a simple switching scheme based on k-out-of-n redundancy. Especially, it can be applied to hierarchical redundancy, which is advantageous in terms of spare effectiveness, redundancy coverage, and replacement control simplicity. The effectiveness of the proposed redundancy is demonstrated through estimates based on the design of an eight-stage binary tree merger WSI (wafer scale integration) with a three-level hierarchical redundancy configuration
Keywords :
VLSI; microprocessor chips; parallel architectures; redundancy; trees (mathematics); defect tolerance; eight-stage binary tree merger WSI; element groups; hierarchical redundancy; k-out-of-n redundancy; leaf elements; redundancy coverage; replacement control; rotary spare replacement redundancy; subroot element; tree architecture WSIs; Binary trees; Corporate acquisitions; Information processing; Laboratories; Redundancy; Switches; Tree graphs; Very large scale integration; Wafer scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Wafer Scale Integration, 1991. Proceedings., [3rd] International Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
0-8186-9126-3
Type :
conf
DOI :
10.1109/ICWSI.1991.151700
Filename :
151700
Link To Document :
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